FISCHERSCOPE X-RAY XDLM 237

Description

FISCHERSCOPE X-RAY XDLM 237 XRF Coating Thickness Measurement System – Helmut Fischer

The FISCHERSCOPE X-RAY XDLM 237 by Helmut Fischer is a professional X-ray fluorescence (XRF) measurement system designed for coating thickness measurement and material analysis. Featuring microfocus X-ray technology, it is suitable for measuring small components, thin electroplated coatings, and irregularly shaped parts. Ideal for industrial quality control, electronics manufacturing, electroplating, and production inspection.

FISCHERSCOPE X-RAY XDLM 237 a high-quality, energy-dispersive X-ray fluorescence device (EDXRF) for non-destructive layer thickness measurement and material analysis.
The device is specifically designed for the requirements in electroplating,
electronics manufacturing, and quality assurance in series production.
The fully automatic XY measuring table, the top-down measurement direction, and
the small measurement spot enable precise analyses even for small, uneven, or complex test objects.

Application

Electroplating: layer thicknesses such as Zn/Fe, Ni/Cu, Cr/Ni, etc.
Electronics: contacts & printed circuit boards (e.g., Au/Ni/Cu, Sn/Cu)
Tool coating: PVD/CVD layers on hard metal
Material analysis: analysis of alloys, baths, or liquids
Quality assurance: series testing with automatic process

Conclusion

The XDLM 237 is excellent for:
high-precision layer thickness measurements
automated testing processes
measurement of small areas & irregular geometries
high-quality laboratory or manufacturing environments

Key Features

Microfocus X-ray tube for small measurement areas.
X-ray fluorescence (XRF) technology for non-destructive analysis.
Proportional counter tube detector for short measurement times.
Interchangeable apertures and primary filters.
Integrated video microscope with zoom and crosshairs for positioning.
Multiple measuring table configurations, depending on the model.
Fully enclosed, type-approved radiation protection design.
Suitable for repetitive measurements and production quality assurance.

Technical Specifications

Model: FISCHERSCOPE X-RAY XDLM 237
Measurement direction: from above (Top-Down)
XY table: motorized & programmable, measurement range approx. 300 × 350 mm
Z-axis: 140 mm stroke, motorized
Measuring distance: 0–80 mm (automatic focus compensation – DCM method)
X-ray source: microfocus tungsten tube with beryllium window
Detector: proportional counter tube – fast signal processing
Aperture changer: 4-fold, e.g., Ø 0.1 mm, 0.05×0.05 mm
Filter changer: 3-fold (e.g., Ni, Al, empty)
Camera: high-resolution video camera with zoom & crosshair
Software: WinFTM XDLM-237 EDXRE Version 6.33
Dimensions approx. 570×760×650 mm
VAC(VDC) 230 V
Hz 50-60 Hz
VA(A) 120 W
Weight: 120 kg

Includes of delivery:
FISCHERSCOPE X-RAY XDLM 237
Calibration standards, PC with WinFTM
with software: WinFTM XDLM-237 EDXRE Version 6.33
User manual (printout)
Power connection cable