SciAps X-200 XRF Analyzer

Description

SciAps X-200 XRF Analyzer – Portable Handheld X-Ray Fluorescence Analyzer for Alloy Identification, PMI, Mining, Soil and RoHS Testing

The SciAps X-200 XRF Analyzer is a portable handheld X-ray fluorescence instrument designed for fast, non-destructive elemental analysis and material identification. It combines a 20 mm² silicon drift detector (SDD), optimized X-ray tube and detector geometry, and multiple application-specific analysis packages in a compact handheld design.

The X-200 is suitable for alloy identification, positive material identification (PMI), scrap sorting, mining, soil analysis, RoHS compliance testing, precious-metal analysis, coatings, and other material-analysis applications. Depending on configuration, it uses a 40 kV Rh-anode or 50 kV Au-anode X-ray tube and supports fundamental-parameter, Compton normalization, and empirical calibration methods.

Main Benefits

Provides fast, non-destructive elemental analysis.
Supports alloy identification and PMI applications.
Suitable for scrap-metal sorting and material verification.
Supports mining, exploration, and environmental soil analysis.
Offers dedicated RoHS and restricted-substance testing capabilities.
Provides precious-metal analysis options.
Compact handheld design supports field and shop-floor testing.
20 mm² SDD provides high-performance elemental detection.
Wi-Fi, Bluetooth, and USB connectivity support data transfer and reporting.
Internal calibration checking helps automate energy-scale validation.

Key Features

Handheld XRF analyzer for non-destructive material analysis.
20 mm² silicon drift detector (SDD).
5 W X-ray tube.
40 kV Rh-anode configuration for alloy applications.
50 kV Au-anode configuration for mining, soil, RoHS, and other applications.
6-position X-ray filter wheel for beam optimization.
125 kcps detector rate with more than 90% live time.
3.5-inch color capacitive touchscreen.
Built-in rechargeable lithium-ion battery.
Hot-swap battery capability with a maximum 60-second swap time.
Wi-Fi, Bluetooth, USB, and GPS capability.
Compatible with SciAps Profile Builder PC software.
Internal 316 stainless-steel shutter for automated calibration checks.
Application packages for alloys, mining, soils, RoHS, precious metals, coatings, and other material-analysis requirements.

Key Specifications

Manufacturer: SciAps
Model: X-200
Product type: Handheld XRF Analyzer
Technology: X-ray fluorescence spectroscopy
Detector: 20 mm² silicon drift detector (SDD)
Detector resolution: <140 eV FWHM at the 5.95 Mn K-alpha line
X-ray tube: 5 W
Maximum tube voltage: 50 kV
Maximum tube current: 200 µA
Anode options: Rh or Au, depending on application
Detector rate: 125 kcps
Live time: >90%
X-ray filtering: 6-position filter wheel
Display: 3.5-inch / 89 mm color capacitive touchscreen
Weight: Approximately 3.1 lb / 1.4 kg with battery
Dimensions: 9.38 × 11.15 × 3.34 in / 238 × 283 × 84 mm
Battery: Rechargeable lithium-ion
Communications: Wi-Fi, Bluetooth, USB
GPS: GPS capable
Operating temperature: 10°F to 130°F / -12°C to 54°C at 25% duty cycle
Processor: 1.2 GHz ARM Cortex-A53 quad-core
RAM: 2 GB LPDDR3
Storage: 16 GB eMMC
Calibration: Fundamental parameters, Compton normalization, or empirical calibration depending on application
Typical applications: Alloy analysis, PMI, scrap sorting, mining, soil analysis, RoHS, precious metals, coatings, and environmental testing
Regulatory: CE, RoHS, USFDA registered, and Canada RED Act.

Applications

Positive Material Identification (PMI)
Alloy identification
Scrap-metal sorting
Stainless-steel and specialty-alloy analysis
Mining and mineral exploration
Geochemical analysis
Environmental soil testing
RoHS compliance testing
Restricted-substance analysis
Precious-metal analysis
Coating analysis
Material verification
Non-destructive testing
Quality control
Field material inspection

SciAps specifically identifies the X-200 for NDT/PMI and scrap-sorting applications, while its application packages extend to mining, soils, RoHS, precious metals, and other analytical requirements.

Typical Users
NDT and PMI inspectors
Scrap-metal processors
Recycling companies
Mining and exploration companies
Environmental laboratories
Manufacturing companies
Quality-control departments
Metal traders and buyers
Foundries and fabricators
Precious-metal professionals
Regulatory and compliance testing teams

What is the SciAps X-200 used for?
The X-200 is used for elemental analysis and material identification in applications such as alloy identification, PMI, scrap sorting, mining, soil analysis, RoHS testing, and precious-metal analysis.

What type of detector does the X-200 use?
The X-200 uses a 20 mm² silicon drift detector (SDD) with a stated resolution of less than 140 eV FWHM at the 5.95 Mn K-alpha line.

Can the X-200 analyze aluminum alloys?
Yes. The X-200 supports aluminum-alloy analysis, although measurement times can vary depending on the alloy and elements being measured. SciAps identifies the X-200 as suitable for alloy applications including aluminum.

Can the X-200 be used for PMI?
Yes. SciAps lists the X-200 for NDT and PMI applications, including alloy identification and verification.

Can it be used for mining and soil analysis?
Yes. Dedicated mining and environmental-soil application packages are available, with elemental suites designed for exploration, pathfinder, environmental, and mining applications.

Does the X-200 support RoHS testing?
Yes. The X-200 supports RoHS and restricted-substance analysis, including elements such as Pb, Hg, Cd, Br, and Cr depending on the application configuration.

What connectivity does the X-200 provide?
The analyzer supports Wi-Fi, Bluetooth, and USB connectivity. It can also work with SciAps Profile Builder PC software, and GPS capability is available.